亚洲色偷偷偷鲁精品,国产69精品久久久久久9999,日本黄色亚洲成人日韩欧美,黄色av日韩免费在线观看


免費(fèi)注冊(cè)快速求購(gòu)


分享
舉報(bào) 評(píng)價(jià)

TESA 2000 太陽(yáng)光譜反射率及發(fā)射率測(cè)量?jī)x

參考價(jià)面議
具體成交價(jià)以合同協(xié)議為準(zhǔn)
  • 公司名稱(chēng) 光傲科技股份有限公司
  • 品牌
  • 型號(hào)
  • 所在地
  • 廠(chǎng)商性質(zhì) 其他
  • 更新時(shí)間 2021/1/6 15:44:09
  • 訪(fǎng)問(wèn)次數(shù) 537

該廠(chǎng)商其他產(chǎn)品

我也要出現(xiàn)在這里

TESA2000是在TEMP2000A基礎(chǔ)上增加光譜半球反射率測(cè)定功能,光譜范圍250nmto2500nm,主要用于材料太陽(yáng)光譜吸收、反射特性測(cè)試。

詳細(xì)信息 在線(xiàn)詢(xún)價(jià)

TESA 2000 太陽(yáng)光譜反射率及發(fā)射率測(cè)量?jī)x

TESA2000是在TEMP 2000A基礎(chǔ)上增加光譜半球反射率測(cè)定功能,光譜范圍250 nm to 2500 nm ,主要用于材料發(fā)射率、太陽(yáng)光譜吸收、反射特性測(cè)試。

The TESA 2000 can be conveniently used in a laboratory setting (top right image) where samples can be sat atop the instrument and left while repeated measurements are being taken, or as a portable unit (bottom right image).

The TESA 2000 provides in a single unit:

1) A portable emissometer/reflectometer that performs optically integrated total hemispheric reflectance measurements from less than 3 to greater than 35 micrometers wavelength. Thus, performing the same measurement as the (the recognized replacement for the no longer produced Gier Dunkle DB-100 IR Reflectometer**), providing improved emittance determination performance and maintainability, and in accordance with the ASTM E408 standard.

2) A portable solar reflectometer that performs optically integrated total hemispheric reflectance measurements.

The TESA 2000 optical system has been designed to minimize losses, to facilitate and maintain optical alignment, and to utilize the features of AZ Technology's patented ellipsoid collector (Patent Number 5,659,397) that allows compactness for portability, efficiency, and measurement accuracy. The instrument is fully portable and can be used in the most remote locations. The instrument is available with carrying cases (which will fit in the overhead bin of most jet aircraft), rechargeable batteries, battery charger, instrument inspection head, display unit, and an operator vest.

The table below lists specifications for the TESA 2000.

Emittance wavelength<3um to="">35um (not limited by filters, windows, etc.)
Reflectance wavelength250 to 2500 nm
Measurement accuracy (for specular and diffuse samples)- ± 1% of full scale for gray samples
- ± 3% of full scale for non-gray samples
Repeatability- ± 0.5% of full scale or better
Sample typeAny Sample, including foils, insulators, etc.
Sample size and geometryFlat Surfaces: ≥ 0.4 inches (1 cm) diameter
Sample temperatureRoom Temperature, Ambient
Readouts

-Digital LCD panel meter
-Selectable solar reflectance solar absorption and IR reflectance/emittance display

Measurement range (reflectance)0.05 to 1.00

Dimensions

-Optical Head: 5" diameter x 8" long
-Control and Display Unit: 7.5 x 5.5 x 3 inches
-Battery Box: 7.5 x 6.25 x 4.0 inches
-Carry Case: 12.5 x 17 x 11 inches

Weight-Optical Head: 6 pounds
-Control and Display Unit: 3.25 pounds
-Battery Box: 11 pounds
-Carry Case: 9 pounds
Warranty1 year parts and labor

*Note: terms reflectance, emittance and absorptance and terms reflectivity, emissivity and absorptivity are often used interchangeably. **The TESA 2000 represents an excellent option for replacing a Gier Dunkle DB100 while adding more capabilities and increased portability



同類(lèi)產(chǎn)品推薦


提示

×

*您想獲取產(chǎn)品的資料:

以上可多選,勾選其他,可自行輸入要求

個(gè)人信息: